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Research topics index

Process variations-aware design

Design of CMOS RF circuits

IC test

Failure analysis
The presence of random spot defects is inherent with nowadays silicon circuits manufacturation. Test is the procedure to detect defective devices. Read More ...
Current testing
Test of IC's is nowadays a topic of great importance due to the size and complexity of present IC's. Test by monitoring the consumption current (current testing) has been used as a complementary test to classical test techniques. Read More ...
Thermal testing
IC technology and design tendencies require new test strategies. Our research group is working on a new test strategy named thermal testing. The goal of this test technique is to detect if a circuit has structural defects by measuring the temperature at some points of the surface of the silicon where the circuit under test is placed. Read More ...

Signal Integrity

Interconnections and packages
Crosstalk between interconnect lines is a phenomenon increasingly important in modern integrated circuit technologies. Read More ...
Switching and Substrate noise in RFICs
One of the main obstacles in the implementation of communication Systems On a single Chip (SoC) in CMOS technology is the noise coupled through the substrate between the parts in the system. Read More ...

Energy Harvesting Systems

Human passive power
There is an increasing demand for portable electronics which depend on batteries, and need to be recharged periodically. On the other hand, the power necessary to operate electronic devices goes down, and this trend opens a possibility to increase the autonomy of these devices by using the energy generated by the user in its normal activity. Read More ...

UWB

CMOS UWB wireless communications systems
In CMOS UWB wireless communication systems we combine both  technologys (CMOS and UWB)  in order to develop low power wireless communication systems. Read More ...

Low Power

Adiabatic switching
Low power digital design has became nowadays an investigation area of great interest, basically because of the high demand of portable electronic equipments, and also because of the difficulties removing heat from high complexity IC. Read More ...

Thermal Effects

Thermal sensors
Thermal testing needs temperature sensors sensitive to temperature variations of the silicon surface thermal map due to the presence of a failure but insensitive to offset temperature variations of this map generated, for instance, by ambient temperature changes. Read More ...