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Maragda (Spanish MINECO) (2014-2017)
The project acronym (MARAGDA) stands for “Multilevel approach to the reliability-aware design of analog and digital integrated circuits“. The project goal is to develop a design methodology (covering from fabrication up to applications) that can efficiently tackle variability and aging in modern nanoscale CMOS technologies.
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Overall group activity, maintained by UPC Futur portal.
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UPCommons E-prints page
Link to the HIPICS papers repository in UPCommons (not exhaustive)
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PhD theses
PhD theses page, maintained by UPC Futur portal.
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MODERN (ENIAC JU) (2009-2012)
The influence of process variations is becoming extremely critical for nanoCMOS technology nodes, due to geometric tolerances and manufacturing non-idealities (such as edge or surface roughness, or the fluctuation of the number of doping atoms)...
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Synaptic (FP7) (2009-2012)
The project targets the optimisation of manufacturability and the reduction of systematic variations in nanometer technologies through exploitation of regularity at the architectural, structural, and geometrical levels.
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TeraSystems (Spanish MICINN) (2009-2013)
CMOS semiconductor technology is nowadays the dominant technology for integrated circuit manufacturing, and it is expected that it will continue to be so for the next five years. However, the continuing trends of device scaling and increase in complexity towards terascale system on chip level of integration...
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Carmina García Almudéver
Variability and Reliability Analysis of Carbon Nanotube Technology in the Presence of Manufacturing Imperfections, July 29, 2014
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PhD Graduates
Sergio Gómez Fernández
Regular Cell Design Approach Considering Lithography-Induced Process Variations, October 17, 2014
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