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DRAC (ERDF) (2019-2023)
Designing RISC-V-based Accelerators for next generation Computers (DRAC) will design, verify, implement and fabricate a high performance general purpose processor that will incorporate different accelerators based on the RISC-V technology, with specific applications in the field of security, genomics and autonomous navigation.
Located in Research / Active research projects
Together (Spanish MINECO) (2016-2021)
The project acronym (TOGETHER) stands for “Towards Trusted Low-Power Things: Devices, Circuits and Architectures. The project goal is to work on the design of low-power, variability-resilient nanoelectronic circuits and systems, by using a multilevel approach and taking into account IoT challenges.
Located in Research / Active research projects
Past research projects
Expired research projects (since 2009)
Located in Research
TeraSystems (Spanish MICINN) (2009-2013)
CMOS semiconductor technology is nowadays the dominant technology for integrated circuit manufacturing, and it is expected that it will continue to be so for the next five years. However, the continuing trends of device scaling and increase in complexity towards terascale system on chip level of integration...
Located in Research / Past research projects
TRAMS (FP7) (2010-2012)
Technology projections indicate that future electronic devices will keep shrinking, being faster and consuming less energy per operation. In the next decade, a single chip will be able to perform trillions of operations per second and provide trillions of bytes per second in off-chip bandwidth. This is the so called Terascale Computing era, where terascale performance will be mainstream, available in personal computer, and being the building block of large data centers with petascale computing capabilities. However, these smaller devices will be much more susceptible to faults and its performance will exhibit a significant degree of variability...
Located in Research / Past research projects
Synaptic (FP7) (2009-2012)
The project targets the optimisation of manufacturability and the reduction of systematic variations in nanometer technologies through exploitation of regularity at the architectural, structural, and geometrical levels.
Located in Research / Past research projects
MODERN (ENIAC JU) (2009-2012)
The influence of process variations is becoming extremely critical for nanoCMOS technology nodes, due to geometric tolerances and manufacturing non-idealities (such as edge or surface roughness, or the fluctuation of the number of doping atoms)...
Located in Research / Past research projects
Maragda (Spanish MINECO) (2014-2017)
The project acronym (MARAGDA) stands for “Multilevel approach to the reliability-aware design of analog and digital integrated circuits“. The project goal is to develop a design methodology (covering from fabrication up to applications) that can efficiently tackle variability and aging in modern nanoscale CMOS technologies.
Located in Research / Past research projects
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