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Thermal sensors

Coordinator:
Josep Altet
Team:
Josep Altet, Antonio Rubio, José Luis Gálvez
Description:
Thermal testing needs temperature sensors sensitive to temperature variations of the silicon surface thermal map due to the presence of a failure but insensitive to offset temperature variations of this map generated, for instance, by ambient temperature changes.

That can be achieved by using differential temperature sensors, whose output voltage (or current) is proportional to the difference of temperature between two different points of the silicon surface.

The group is currently working in: CMOS and BiCMOS differential temperature sensor design, electro-thermal analysis methods and thermal characterization of electro-thermal circuits.
 
Related recent projects:
  • Design of CMOS structures for differential measurement of temperature in ICs