Current testing

Test of IC's is nowadays a topic of great importance due to the size and complexity of present IC's. Test by monitoring the consumption current (current testing) has been used as a complementary test to classical test techniques. Our group has been working on this subject by developing new current sensors (both static and dynamic sensors) and new partition strategies of standard-cell based designs taking into account current sensors placement. We have studied also the extension of current testing to analog sections, as operational amplifiers or ADC's.